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The Charged Device Model (CDM) test simulates how the device acts when the device itself has an electrostatic charge and the effects of the discharge when it comes in contact with a metallic surface. This type of discharge is the most common type of ESD in electronic devices and is the main cause of ESD damage during the manufacturing process. CDM discharge depends mainly on parasitic parameters of the discharge and is strongly dependent on the size and type of component package.
PTM Published on: 2012-10-01
